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	<title>Boundary Scan Test and Debug</title>
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	<description>Debug and Boundary-Scan Test Tools</description>
	<pubDate>Wed, 30 Jan 2008 20:33:29 +0000</pubDate>
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		<title>JTAG Boundary-Scan Vs. JTAG Emulation (ICE)</title>
		<link>http://www.etoolsmiths.com/blog/jtag-boundary-scan-vs-jtag-emulation-ice/</link>
		<comments>http://www.etoolsmiths.com/blog/jtag-boundary-scan-vs-jtag-emulation-ice/#comments</comments>
		<pubDate>Sat, 04 Aug 2007 20:36:33 +0000</pubDate>
		<dc:creator>admin</dc:creator>
		
		<category><![CDATA[Boundary Scan]]></category>

		<guid isPermaLink="false">http://www.etoolsmiths.com/blog/jtag-boundary-scan-vs-jtag-emulation-ice/</guid>
		<description><![CDATA[One question that I often hear is: “What’s difference between JTAG Boundary-Scan Test and JTAG Emulation or a JTAG ICE?”
First off, these two methods share common functions such as: hardware bring-up, device programming and even some basic hardware test functionality. The big difference is that test systems are designed to do extensive hardware testing of [...]]]></description>
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		<title>Design for Test (DFT)</title>
		<link>http://www.etoolsmiths.com/blog/design-for-test-dft/</link>
		<comments>http://www.etoolsmiths.com/blog/design-for-test-dft/#comments</comments>
		<pubDate>Thu, 12 Jul 2007 09:47:21 +0000</pubDate>
		<dc:creator>admin</dc:creator>
		
		<category><![CDATA[Circuit Board Test]]></category>

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		<description><![CDATA[When designing new hardware that employs Ball Grid Array (BGA) devices, it is  critical to adhere to design for test (DFT) guidelines. DFT guidelines allow you  to design your board in such a way that the highest possible percentage of your  hardware is tested. Many Boundary Scan Test tool vendors provide design [...]]]></description>
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