A
ASIC – An Application Specific Integrated Circuit (I.C.). This is essentially a custom integrated circuit or “chip”, usually designed by an Original Equipment Manufacturer (OEM). OEMs create custom I.C.s to allow them to hide and protect their unique intellectual property. They also need to create them because they have a requirement for functionality that does not currently exist from commercial chip vendors.
ARM7 – A microcontroller based on the ARM7 Core from ARM ltd. in the UK. Typically has small or no cache and tops out at lower clock speed (80-100Mhz) than it’s big brother the ARM9. ARM7 processors are great for low power (battery based) applications.
ARM9 –A microcontroller based on the ARM7 Core from ARM ltd. in the UK. Provides a cache and runs at much hight clock speeds than ARM7. Also consumes more power.
ARM11 – Based on the ARM11 come. Provides 200Mhz + performance, has a deep pipeline and supports branch prediction.
B
Boundary Scan Definition File (BSDF) – This file describes the built-in JTAG test functionality of an I.C.. These files are supplied by the manufacturer of the device and used by CAD/CAM and printed circuit board layout packages as well as JTAG Boundary Scan Test tools. Boundary-Scan Test Tools – These tools are used by hardware and test engineers to bring up, debug and new electronic hardware.
Boundary Scan Test System – A tool used in manufacturing and production test to verify proper operation of a circuit board. These systems employ JTAG boundary-scan to allow them to detect open circuits, short circuits and stuck at (0 or 1) faults.
Ball Grid Array (BGA) – A type of packaging uses with semiconductors. This package is a “surface mount” style meaning that it has balls instead of pins that are soldered directly to a printed circuit board. Boundary-Scan Test systems are needed to test this type of device because the connections to the chip are not accessible.
C
Cross Compiler -A program that translates high level computer language instructions (programs) into a format understood by a specific microprocessor. This allows the microprocessor hardware to run the program. The term cross comes from the fact that the file being generated to run is for a different processor than the one where the compiler program runs. An example would be running a ‘C’ language cross compiler for the ARM processor family on a windows PC. Windows PCs use X86 based processors while the file generated by the tool is targeted (designed to run on) an ARM processor.
CPLD Programming – The process of programming data into a custom programmable logic device. This process can be done via a JTAG interface cable, boot code or an external device programmer.
D
Design for Test (DFT) – Design for test is the practice of designing testability into you electronic designs. By adhering to DFT guidelines, you improve overall test coverage and reduce defects.